دانلود کتاب میکروسکوپ نیروی اتمی – مقدمه‌ای مختصر

This textbook originated in courses on Atomic Force Microscopy (AFM) atWorcester Polytechnic Institute (WPI); the first rendition of the course was in 2001. Targeted towards second-year undergraduates in science and engineering, it attracted learners from first-year students to retired professionals. It was clear that the skill levels of such a wide range of people varied widely, motivating the course’s subsequent split into undergraduate and graduate versions. The undergraduate version, PH 2510, is taught over seven weeks, corresponding to one of WPI’s undergraduate terms. The graduate version, PH 561, is taught over a fourteen-week semester, which graduate students find easier to accommodate their other responsibilities. Starting in 2015, I led the teaching of the material to predominantly graduate students in Materials Science at ETH Zurich. This block course runs outside of the semester in a two-week, all-day, every-day format. While the fundamental AFM-related content is the same for all three courses, I vary the level of writing and projects expected. For the longer courses at WPI, I require six formal instrument lab reports, with the aim to prepare students for scientific communication at the level of a draft of a manuscript for submission to Applied Physics Letters. Because the undergraduate version of the course is timerestricted compared to the graduate version, there is no room in the syllabus for a laboratory-based project. Instead, undergraduates are asked to give short talks on two related papers from the AFM literature. The graduate students, on the other hand, have a few weeks to conduct a lab project on a topic of interest to them. For the two-week block course at ETH Zurich, the emphasis on writing is put aside, yet two three-hour lab sessions are scheduled for a “nano” project, with the morning of the last day devoted to student presentations. I chose to cover fewer topics at a fundamental level, rather than many topics at a graduate or higher level: there are many, many AFM modes of operation and a vast, vast literature that I omit so as to concentrate on the basics of AFM within about two hundred pages—concisely yet comprehensively. The intent is to educate the curious to competently use AFM and provide them a firm foundation for further study, be they students in a course or independent learners. Although perhaps a dozen books on AFM have been previously published, to my knowledge, this is the first textbook on AFM, with learning objectives, suggestions for further reading, and problems at the end of each chapter. The reading lists are short, so as to not overwhelm the reader. The suggested readings fall into one of three categories: influential or illustrative historical publications, tutorial-style works, or “full-story” books. I also include a few of my own relevant contributions; the full list is at Google Scholar and Orcid.org. (The latter is less frequently updated.) The appendices provide compiled learning objectives (Appendix A), advice for conducting experiments (Appendix B), a description of the electronic supplement available free to interested readers (Appendix C), and lists of acronyms and symbols (Appendices D and E). These are followed by the answers to the end-of-chapter problems, which should be helpful to independent learners. The final section is an index. Within the text, I note the relevance of complementary material from my YouTube/AtomicForceMicro channel or from the supplement by means of boxed or highlighted stand-alone sentences. The background assumed for this textbook is first-year physics and calculus, except for the last chapter on oscillators, for which an understanding of differential equations and complex numbers is needed. Some introductory physics and materials science is incorporated within Chap. 5. The perspective is that of a physicist—readers might notice some subtle and not-so-subtle physics lessons! The goal is to ensure that both students and independent learners are well prepared for their research, be it senior capstones, graduate studies, or professional work. At WPI, students with majors in the sciences (physics, applied physics, mathematics, computer science, environmental science) and engineering (biomedical, chemical, electrical), have all prospered in the course, as well as those with minors in physics, materials engineering, and nanoscience. At ETH Zurich, the predominant group of enrollees has been Masters students in materials science, as well as a smattering of PhD students in materials, chemistry, and civil engineering. This textbook is organized into two parts. The first part covers fundamentals of AFM: an introduction to AFM principles, the challenges of imaging, an overview of related instruments, and the more common AFM modes of operation, and AFM design and calibration. The second part concentrates on a mode of data acquisition that requires interpretation based on materials physics, that of force-curve acquisition and its subsequent analysis. Along the way, some basics of physics and materials science are explained, as well as different kinds of intermolecular and contact forces that can act between the AFM tip and sample. Finally, in the last chapter intended for intermediate-level or higher science and engineering students, models for cantilever oscillation are presented. I hope this textbook will elevate readers’ AFM skills and open the door to fascinating future studies of the nanoscale.